Fabrication and characterization of Co, Al:ZnO thin films by a sol-gel spin coating technique for ferromagnetic applications

R. Siddheswaran, R. V. Mangalaraja, Ricardo E. Avila, Maria Elena Gómez, D. Manikandan, Marta Lopez, C. Esther Jeyanthi, S. Ananthakumar

Resultado de la investigación: Contribución a una revistaArtículorevisión exhaustiva

3 Citas (Scopus)

Resumen

Transparent polycrystalline ZnO and Co,Al co-doped ZnO [Zn1-x-yCoxAlyO; x = 0.03; y = 0.02] thin films were fabricated using sol-gel spin coating on glass substrates and subsequently annealed at 500 °C for 2 h in an ambient atmosphere. The decomposition of the precursors and formation of the metal oxide during annealing was explained by thermal analysis. X-ray crystal diffraction analysis on the co-doped ZnO thin films confirmed the formation of the hexagonal wurtzite structure. Microstructural studies revealed that the films were filled with particulates of sizes ranging between 40-50 nm and with a uniform film thickness of about 700 nm after annealing at 500 °C. Atomic force microscopy (AFM) images demonstrated a fine and smooth surface of the thin films. The spin coated films have also been shown to possess polycrystalline grains with a compact and void-free morphology. The energy dispersive X-ray spectroscopic (EDS) analysis confirmed the presence of Co, Al, Zn and O. The room temperature (300 K) ferromagnetic behavior of Co, Al co-doped ZnO thin films is also discussed.

Idioma originalInglés
Páginas (desde-hasta)801-805
Número de páginas5
PublicaciónJournal of Ceramic Processing Research
Volumen13
N.º6
EstadoPublicada - 2012
Publicado de forma externa

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