We report measurements of the topography of a gold film deposited on a mica substrate using scanning tunneling microscope (STM), and measurements of the conductivity σ of the film performed between 4 and 300 K. From images obtained with the STM running in air in the constant current mode of a gold sample 70-nm-thick deposited under UHV on a mica substrate preheated to 300 °C, we compute the average autocorrelation function (ACF) that characterizes the surface of the film in the scale of (Formula presented) and determine by least-squares fitting the parameters δ (rms. amplitude) and ξ (lateral correlation length) corresponding to an exponential that best describes the average ACF data. Using an exponential representation of the ACF, the parameters δ and ξ determined from STM measurements, and a modified version of the theory of Sheng, Xing, and Wang recently proposed [R. C. Munoz et al., J. Phys.: Condens. Matter 11, L299 (1999)], we calculate the temperature dependence of the bulk resistivity (Formula presented) and of the increase in resistivity (Formula presented) induced by electron-surface scattering on this film. The result is that (Formula presented) amounts to about 2.6% at 300 K, and increases linearly with increasing mean free path, to about 10.5% at 4 K. The increase in resitivity Δρ turns out to be weakly temperature dependent.
|Number of pages||4|
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|State||Published - 2000|