Quantifying the Impact of Random Surface Perturbations on Reflective Gratings

Gerardo Silva-Oelker, Ruben Aylwin, Carlos Jerez-Hanckes, Patrick Fay

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

We present a novel deterministic method capable of calculating statistical moments of transverse electric polarized fields scattered by perfect electric conductor gratings with small surface random perturbations. Based on a first-order shape Taylor expansion, the resulting electric field integral equations are solved via the method of moments with constant hierarchical basis or Haar wavelets. This allows for a sparse tensor approximation, significantly reducing the number of required unknowns and yielding a higher rate of convergence than a dense approximation. Moreover, the proposed approach converges faster than Monte Carlo simulations with significantly less computational effort. Validation of the proposed approach is performed for several cases, and realistic simulations applied to the calculation and prediction of grating efficiency reveal the applicability of the method.

Original languageEnglish
Article number8169061
Pages (from-to)838-847
Number of pages10
JournalIEEE Transactions on Antennas and Propagation
Volume66
Issue number2
DOIs
StatePublished - Feb 2018

Keywords

  • Gratings
  • moment methods
  • random media
  • surfaces
  • uncertainty
  • wavelets

Fingerprint

Dive into the research topics of 'Quantifying the Impact of Random Surface Perturbations on Reflective Gratings'. Together they form a unique fingerprint.

Cite this