Noise susceptibility measurements of front-end electronics systems

  • B. Allongue
  • , F. Anghinolfi
  • , G. Blanchot
  • , F. Faccio
  • , C. Fuentes
  • , S. Michelis
  • , S. Orlandi
  • , A. Toro

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

The conducted and radiated noise that is emitted by a power supply constrains the noise performance of the frontend electronics system that it powers. The characterization of the noise susceptibility of the front-end electronics allows setting proper requirements for the back-end power supply in order to achieve the expected system performance. A method to measure the common mode current susceptibility using current probes is presented. The compatibility between power supplies and various front-end systems is explored.

Original languageEnglish
Title of host publicationProceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2008
PublisherCERN
Pages316-320
Number of pages5
ISBN (Print)9789290833246
StatePublished - 2008
Externally publishedYes
EventTopical Workshop on Electronics for Particle Physics, TWEPP 2008 - Naxos, Greece
Duration: 15 Sep 200819 Sep 2008

Publication series

NameProceedings of the Topical Workshop on Electronics for Particle Physics, TWEPP 2008

Conference

ConferenceTopical Workshop on Electronics for Particle Physics, TWEPP 2008
Country/TerritoryGreece
CityNaxos
Period15/09/0819/09/08

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