DC-DC converters in 0.35μm CMOS technology

S. Michelis; B. Allongue; G. Blanchot; F. Faccio; C. Fuentes; S. Orlandi; S. Saggini; S. Cengarle; F. Ongaro

doi:10.1088/1748-0221/7/01/C01072

DC-DC converters in 0.35μm CMOS technology

S. Michelis
, B. Allongue
, G. Blanchot
, F. Faccio
, C. Fuentes
, S. Orlandi
, S. Saggini
, S. Cengarle
, F. Ongaro

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

In view of the upgrade of the LHC experiments, we are developing custom DC/DC converters for a more efficient power distribution scheme. A new prototype have been integrated in ASICs in the selected 0.35μm commercial high voltage technology that has been successfully tested for all radiation effects: TID, displacement damage and Single Event Burnout. This converter has been optimized for high efficiency and improved radiation tolerance. Amongst the new features the most relevant are the presence of internal linear regulators, protection circuits with a state-machine and a new pinout for a modified assembly in package in order to reduce conductive losses. This paper illustrates the design of the prototype followed by functional and radiation tests.

Original language	English
Article number	C01072
Journal	Journal of Instrumentation
Volume	7
Issue number	1
DOIs	https://doi.org/10.1088/1748-0221/7/01/C01072
State	Published - Jan 2012
Externally published	Yes

Keywords

Front-end electronics for detector readout
Radiation damage to electronic components
Radiation-hard electronics
Voltage distributions

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10.1088/1748-0221/7/01/C01072

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AU - Michelis, S.

AU - Allongue, B.

AU - Blanchot, G.

AU - Faccio, F.

AU - Fuentes, C.

AU - Orlandi, S.

AU - Saggini, S.

AU - Cengarle, S.

AU - Ongaro, F.

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AB - In view of the upgrade of the LHC experiments, we are developing custom DC/DC converters for a more efficient power distribution scheme. A new prototype have been integrated in ASICs in the selected 0.35μm commercial high voltage technology that has been successfully tested for all radiation effects: TID, displacement damage and Single Event Burnout. This converter has been optimized for high efficiency and improved radiation tolerance. Amongst the new features the most relevant are the presence of internal linear regulators, protection circuits with a state-machine and a new pinout for a modified assembly in package in order to reduce conductive losses. This paper illustrates the design of the prototype followed by functional and radiation tests.

KW - Front-end electronics for detector readout

KW - Radiation damage to electronic components

KW - Radiation-hard electronics

KW - Voltage distributions

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DC-DC converters in 0.35μm CMOS technology

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Keywords

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