Automatic multiple visual inspection on non-calibrated image sequence with intermediate classifier block

Miguel Carrasco, Domingo Mery

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Automated inspection using multiple views (AMVI) has been recently developed to automatically detect flaws in manufactured objects. The principal idea of this strategy is that, unlike the noise that appears randomly in images, only the flaws remain stable in a sequence of images because they remain in their position relative to the movement of the object being analyzed. This investi- gation proposes a new strategy, based on the detection of flaws in a non- calibrated sequence of images. The method uses a scheme of elimination of potential flaws in two and three views. To improve the performance, intermediate blocks are introduced that eliminate those hypothetical flaws that are regular regions and real flaws. Use is made of images captured in a non-calibrated vision system, so there are no optical, geometric and noise disturbances in the image, forcing the proposed method to be robust, so that it can be applied in industry as a quality control method in non-calibrated vision systems, the results show that it is possible to detect the real flaws and at the same time decrease most of the false alarms.

Original languageEnglish
Title of host publicationAdvances in Image and Video Technology - Second Pacific Rim Symposium, PSIVT 2007, Proceedings
PublisherSpringer Verlag
Pages371-384
Number of pages14
ISBN (Print)9783540771289
DOIs
StatePublished - 2007
Event2nd Pacific Rim Symposium on Image and Video Technology, PSIVT 2007 - Santiago, Chile
Duration: 17 Dec 200719 Dec 2007

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume4872 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference2nd Pacific Rim Symposium on Image and Video Technology, PSIVT 2007
Country/TerritoryChile
CitySantiago
Period17/12/0719/12/07

Keywords

  • Automated visual inspection
  • Computer vision
  • Defect detection
  • Industrial applications
  • Multiple view geometry

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