Analyzing the Transferability of Collective Inference Models Across Networks

Ransen Niu, Sebastian Moreno, Jennifer Neville

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Collective inference models have recently been used to significantly improve the predictive accuracy of node classifications in network domains. However, these methods have generally assumed a fully labeled network is available for learning. There has been relatively little work on transfer learning methods for collective classification, i.e., to exploit labeled data in one network domain to learn a collective classification model to apply in another network. While there has been some work on transfer learning for link prediction and node classification, the proposed methods focus on developing algorithms to adapt the models without a deep understanding of how the network structure impacts transferability. Here we make the key observation that collective classification models are generally composed of local model templates that are rolled out across a heterogeneous network to construct a larger model for inference. Thus, the transferability of a model could depend on similarity of the local model templates and/or the global structure of the data networks. In this work, we study the performance of basic relational models when learned on one network and transferred to another network to apply collective inference. We show, using both synthetic and real data experiments, that transferability of models depends on both the graph structure and local model parameters. Moreover, we show that a probability calibration process (that removes bias due to propagation errors in collective inference) improves transferability.

Original languageEnglish
Title of host publicationProceedings - 15th IEEE International Conference on Data Mining Workshop, ICDMW 2015
EditorsXindong Wu, Alexander Tuzhilin, Hui Xiong, Jennifer G. Dy, Charu Aggarwal, Zhi-Hua Zhou, Peng Cui
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages908-916
Number of pages9
ISBN (Electronic)9781467384926
DOIs
StatePublished - 29 Jan 2016
Externally publishedYes
Event15th IEEE International Conference on Data Mining Workshop, ICDMW 2015 - Atlantic City, United States
Duration: 14 Nov 201517 Nov 2015

Publication series

NameProceedings - 15th IEEE International Conference on Data Mining Workshop, ICDMW 2015

Conference

Conference15th IEEE International Conference on Data Mining Workshop, ICDMW 2015
Country/TerritoryUnited States
CityAtlantic City
Period14/11/1517/11/15

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