TY - GEN
T1 - A scenario optimization approach to system identification with reliability guarantees
AU - Crespo, Luis G.
AU - Giesy, Daniel
AU - Kenny, Sean
AU - Deride, Julio
N1 - Publisher Copyright:
© 2019 American Automatic Control Council.
PY - 2019/7
Y1 - 2019/7
N2 - This paper proposes an optimization-based framework for the calibration of parametric models according to multi-variate, input-output data. We focus on continuous models whose outputs depend nonlinearly (and possibly implicitly) on the inputs and the parameters. Maximum likelihood and scenario optimization techniques are combined to generate stochastic predictor models having dependent parameters. Furthermore, the reliability of the predictor, as measured by the probability of future data falling outside the predicted output ranges, is formally bounded using non-convex scenario theory. This framework is illustrated by calibrating a linear time invariant model of a system having a non-colocated sensor-actuator pair according to modal analysis data.
AB - This paper proposes an optimization-based framework for the calibration of parametric models according to multi-variate, input-output data. We focus on continuous models whose outputs depend nonlinearly (and possibly implicitly) on the inputs and the parameters. Maximum likelihood and scenario optimization techniques are combined to generate stochastic predictor models having dependent parameters. Furthermore, the reliability of the predictor, as measured by the probability of future data falling outside the predicted output ranges, is formally bounded using non-convex scenario theory. This framework is illustrated by calibrating a linear time invariant model of a system having a non-colocated sensor-actuator pair according to modal analysis data.
UR - http://www.scopus.com/inward/record.url?scp=85072301039&partnerID=8YFLogxK
U2 - 10.23919/acc.2019.8815284
DO - 10.23919/acc.2019.8815284
M3 - Conference contribution
AN - SCOPUS:85072301039
T3 - Proceedings of the American Control Conference
SP - 2100
EP - 2106
BT - 2019 American Control Conference, ACC 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 American Control Conference, ACC 2019
Y2 - 10 July 2019 through 12 July 2019
ER -